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ECCN

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3B002

3B002 Test or inspection equipment “specially designed” for testing or inspecting finished or unfinished semiconductor devices as follows (see List of Items Controlled) and “specially designed” “components” and “accessories” therefor.

Category
Category 3—Electronics
Product group
B. “Test”, “Inspection” and “Production Equipment”

Reason for Control

  • NS
  • RS
  • AT

Official text

License Requirements

Reason for Control:

NS, RS, AT

Control(s) Country chart (see Supp. No. 1to part 738)

  • NS applies to 3B002.a and b NS Column 2.
  • NS applies to 3B002.c To or within Macau or a destination specified in Country Group D:5 of supplement no. 1 to part 740 of the EAR. See § 742.4(a)(4) of the EAR.
  • RS applies to 3B002.c To or within Macau or a destination specified in Country Group D:5 of supplement no. 1 to part 740 of the EAR. See § 742.6(a)(6) of the EAR.
  • AT applies to entire entry AT Column 1.

List Based License Exceptions (See Part 740 for a Description of All License Exceptions)

LVS: $500, except semiconductor manufacturing equipment specified in 3B002.c.

GBS: Yes

List of Items Controlled

Related Controls: See also 3A999.a, 3B992, and 3B993.

Related Definitions: N/A

Items:

a. For testing S-parameters of items specified by 3A001.b.3.

b. For testing microwave integrated circuits controlled by 3A001.b.2.

c. Inspection equipment designed for “EUV” mask blanks or “EUV” patterned masks.

ecfr-15cfr774-supp1-2026-08-28 · effective 2026-08-28

Issue date 2026-08-28. Amendment date 2026-08-28.

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